A Novel DNU Self-Recoverable and SET Pulse Filterable Latch Design for Aerospace Applications

This paper presents a novel double node upset (DNU) self-recoverable and single event transient (SET) pulse filterable latch design in 28 nm CMOS technology. The loop structure formed by C-elements (CEs) ensures that the can self-recover from DNUs. A Schmitt trigger at output filter out pulses anywhere circuit. clock-controlled inverter channel connects input to reduces transmission latency. simulation results show proposed is completely immune DNUs, delay power area product (DPAP) reduced more than 50% compared with previous design.